Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images (2009)
Attributed to:
Nitrides for the 21st century
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.33515
Publication URI: https://www.repository.cam.ac.uk/handle/1810/286203
Type: Journal Article/Review