Cross-shaped markers for the preparation of site-specific transmission electron microscopy lamellae using focused ion beam techniques. (2020)

First Author: O'Hanlon T

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.49843

Publication URI: https://www.repository.cam.ac.uk/handle/1810/302771

Type: Journal Article/Review