Characterization of buried interfaces using Ga Ka hard X-ray photoelectron spectroscopy (HAXPES). (2022)

First Author: Spencer B

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.86088

Publication URI: https://www.repository.cam.ac.uk/handle/1810/338675

Type: Journal Article/Review