Metal Films on Two-Dimensional Materials: van der Waals Contacts and Raman Enhancement (2024)
Attributed to:
Expanding the Environmental Frontiers of Operando Metrology for Advanced Device Materials Development
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsami.3c15598
PubMed Identifier: 38318783
Publication URI: http://europepmc.org/abstract/MED/38318783
Type: Journal Article/Review
Parent Publication: ACS Applied Materials & Interfaces
Issue: 6
ISSN: 1944-8244