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Direct Visualization of Chemical Transport in Solid-State Chemical Reactions by Time-of-Flight Secondary Ion Mass Spectrometry (2024)

First Author: Pham S

Attributed to: Nanoscale photophysics at defects and interfaces in organic semiconductors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acs.nanolett.4c00021

Publication URI: http://dx.doi.org/10.1021/acs.nanolett.4c00021

Type: Journal Article/Review

Parent Publication: Nano Letters

Issue: 12