X-ray reflectivity method for the characterization of InGaN/GaN quantum well interface (2017)
Attributed to:
Science Bridge Award USA: Harnessing Materials for Energy
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.8289
Publication URI: https://www.repository.cam.ac.uk/handle/1810/262986
Type: Journal Article/Review