Highly stable amorphous zinc tin oxynitride thin film transistors under positive bias stress (2017)

First Author: Niang K
Attributed to:  The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.22002

Publication URI: https://www.repository.cam.ac.uk/handle/1810/274854

Type: Journal Article/Review