The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors (2021)
Attributed to:
Additive-Stabilized Polymer Electronics Manufacturing (ASPEM)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.66965
Publication URI: https://www.repository.cam.ac.uk/handle/1810/319841
Type: Journal Article/Review