Defect structures in (001) zincblende GaN/3C-SiC nucleation layers (2021)
Attributed to:
EPSRC Manufacturing Fellowship in Gallium Nitride
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.68715
Publication URI: https://www.repository.cam.ac.uk/handle/1810/321597
Type: Journal Article/Review