Polarity determination of crystal defects in zincblende GaN by aberration-corrected electron microscopy (2023)
Attributed to:
Fundamental studies of zincblende nitride structures for optoelectronic applications
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.94194
Publication URI: https://www.repository.cam.ac.uk/handle/1810/346779
Type: Journal Article/Review