Spatially Resolved Dielectric Loss at the Si/SiO_{2} Interface. (2024)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.132.256202
PubMed Identifier: 38996269
Publication URI: http://europepmc.org/abstract/MED/38996269
Type: Journal Article/Review
Volume: 132
Parent Publication: Physical review letters
Issue: 25
ISSN: 0031-9007