An ultra high-endurance memristor using back-end-of-line amorphous SiC (2024)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1038/s41598-024-64499-2
Publication URI: http://dx.doi.org/10.1038/s41598-024-64499-2
Type: Journal Article/Review
Parent Publication: Scientific Reports
Issue: 1