Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon (2024)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.chip.2024.100097
Publication URI: http://dx.doi.org/10.1016/j.chip.2024.100097
Type: Journal Article/Review
Parent Publication: Chip
Issue: 3