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Scanning Plasmon-Enhanced Microscopy for Simultaneous Optoelectrical Characterization (2024)

First Author: Symonowicz J

Attributed to: Plasmon-Enhanced FerroElectric Discovery funded by Horizon Europe Guarantee

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsnano.4c04671

Publication URI: http://dx.doi.org/10.1021/acsnano.4c04671

Type: Journal Article/Review

Parent Publication: ACS Nano

Issue: 31