High-Energy Dynamic Avalanche to Failure by Incremental Source-Voltage Increase in Symmetric Double-Trench & Asymmetric Trench SiC MOSFETs (2024)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ojia.2024.3409153
Publication URI: http://dx.doi.org/10.1109/ojia.2024.3409153
Type: Journal Article/Review
Parent Publication: IEEE Open Journal of Industry Applications