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Effective InAsP dislocation filtering layers for InP heteroepitaxy on CMOS-standard (001) silicon (2024)

First Author: Liu S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0219507

Publication URI: http://dx.doi.org/10.1063/5.0219507

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 8

ISSN: 0003-6951