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Suppressing the Memory Effect in Al Doped 3C-SiC Grown Using Chlorinated Chemistry (2024)

First Author: Colston G

Attributed to: Underpinning Power Electronics switch optimisation Theme funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/p-kbxhh8

Publication URI: http://dx.doi.org/10.4028/p-kbxhh8

Type: Journal Article/Review

Parent Publication: Solid State Phenomena