?-Ray-Induced Effects in Al:HfO2-Based Memristor Devices for Memory and Sensor Applications (2024)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/led.2024.3454294
Publication URI: http://dx.doi.org/10.1109/led.2024.3454294
Type: Journal Article/Review
Parent Publication: IEEE Electron Device Letters
Issue: 11