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Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon (2024)

First Author: De Kruijf M

Attributed to: Quantum technology capital: QUES2T (Quantum Engineering of Solid-state Technologies) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.chip.2024.100097

Publication URI: http://dx.doi.org/10.1016/j.chip.2024.100097

Type: Journal Article/Review

Parent Publication: Chip

Issue: 3