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Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interface. (2024)

First Author: Cowie M

Attributed to: Room-Temperature Single Atom Silicon Quantum Electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1073/pnas.2404456121

PubMed Identifier: 39446387

Publication URI: http://europepmc.org/abstract/MED/39446387

Type: Journal Article/Review

Volume: 121

Parent Publication: Proceedings of the National Academy of Sciences of the United States of America

Issue: 44

ISSN: 0027-8424