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Method for Efficient Large-Scale Cryogenic Characterization of CMOS Technologies (2025)

First Author: Eastoe J

Attributed to: Quantum ELecTronics in silIcon Carbide (QELTIC) funded by UKRI FLF

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tim.2024.3497143

Publication URI: http://dx.doi.org/10.1109/tim.2024.3497143

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Instrumentation and Measurement