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Efficient Characterization of Qudit Logical Gates with Gate Set Tomography Using an Error-Free Virtual Z Gate Model. (2024)

First Author: Cao S

Attributed to: Quantum technology capital: QUES2T (Quantum Engineering of Solid-state Technologies) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.133.120802

PubMed Identifier: 39373411

Publication URI: http://europepmc.org/abstract/MED/39373411

Type: Journal Article/Review

Volume: 133

Parent Publication: Physical review letters

Issue: 12

ISSN: 0031-9007