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Characterizing electric fields in semiconductor devices: effect of second-harmonic light interference. (2024)

First Author: Cao Y

Attributed to: Sub-micron 3-D Electric Field Mapping in GaN Electronic Devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/ol.525927

PubMed Identifier: 39008775

Publication URI: http://europepmc.org/abstract/MED/39008775

Type: Journal Article/Review

Volume: 49

Parent Publication: Optics letters

Issue: 14

ISSN: 0146-9592