A method for assessing the spatiotemporal resolution of Structured Illumination Microscopy (SIM) (2020)
Attributed to:
Primed Conversion Oblique Plane Microscopy
funded by
BBSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2008.01146
Publication URI: https://arxiv.org/abs/2008.01146
Type: Preprint