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Characterization of Fe-N nano crystals and nitrogen-containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy (2013)

First Author: Kovacs A

Attributed to: SuperSTEM - the UK aberration-corrected STEM facility funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1307.7871

Publication URI: https://arxiv.org/abs/1307.7871

Type: Other