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Mechanisms of Oxygen Vacancy Aggregation in SiO2 and HfO2 (2019)

First Author: Gao D

Attributed to: Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3389/fphy.2019.00043

Publication URI: http://dx.doi.org/10.3389/fphy.2019.00043

Type: Journal Article/Review

Parent Publication: Frontiers in Physics