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Towards superresolution surface metrology: Quantum estimation of angular and axial separations (2018)

First Author: Napoli C

Attributed to: Metrology for precision and additive manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1805.04116

Publication URI: https://arxiv.org/abs/1805.04116

Type: Other