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Nano-scale imaging of the full strain tensor of specific dislocations extracted from a bulk sample (2019)

First Author: Hofmann F

Attributed to: Strategic Equipment - a Dual Beam FIB/SEM with large area patterning, EBSD and nanoprobe capabilities funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1903.04079

Publication URI: https://arxiv.org/abs/1903.04079

Type: Other