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Efficiently measuring a quantum device using machine learning (2018)

First Author: Lennon D

Attributed to: Quantum Technology Capital: An extensible simulation and test platform for quantum and quantum enabled technologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1810.10042

Publication URI: https://arxiv.org/abs/1810.10042

Type: Other