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Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity (2019)

First Author: Calahorra Y

Attributed to: Centre for Advanced Materials for Integrated Energy Systems (CAM-IES) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1908.05512

Publication URI: https://arxiv.org/abs/1908.05512

Type: Other