Suppression of charge trapping in ON-state operation of AlGaN/GaN HEMTs by Si-rich passivation (2021)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/ac16c3
Publication URI: http://dx.doi.org/10.1088/1361-6641/ac16c3
Type: Journal Article/Review
Parent Publication: Semiconductor Science and Technology
Issue: 9