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3D surface profilometry using neutral helium atoms (2024)

First Author: Radic A

Attributed to: Microscopy with neutral helium atoms: A wide-ranging new technique for delicate samples funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0206374

Publication URI: http://dx.doi.org/10.1063/5.0206374

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 20