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Controlled Fabrication of Native Ultra-Thin Amorphous Gallium Oxide from 2D Gallium Sulfide for Emerging Electronic Applications (2024)

First Author: AlMutairi A

Attributed to: Expanding the Environmental Frontiers of Operando Metrology for Advanced Device Materials Development funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2405.05632

Publication URI: https://arxiv.org/abs/2405.05632

Type: Preprint