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Dielectric breakdown of oxide films in electronic devices (2024)

First Author: Padovani A

Attributed to: Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41578-024-00702-0

Publication URI: http://dx.doi.org/10.1038/s41578-024-00702-0

Type: Journal Article/Review

Parent Publication: Nature Reviews Materials

Issue: 9