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Rapid cryogenic characterization of 1,024 integrated silicon quantum dot devices (2025)

First Author: Thomas E

Attributed to: Silicon-based Fault-Tolerant Quantum Computing funded by UKRI FLF

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41928-024-01304-y

Publication URI: http://dx.doi.org/10.1038/s41928-024-01304-y

Type: Journal Article/Review

Parent Publication: Nature Electronics