Dynamics of Charge Transients in High Voltage Silicon and SiC NPN BJT Under High Injection Levels (2025)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ojpel.2025.3527210
Publication URI: http://dx.doi.org/10.1109/ojpel.2025.3527210
Type: Journal Article/Review
Parent Publication: IEEE Open Journal of Power Electronics