A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry (2025)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3390/photonics12010060
Publication URI: http://dx.doi.org/10.3390/photonics12010060
Type: Journal Article/Review
Parent Publication: Photonics
Issue: 1