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Ultrafast nano-imaging of dark excitons (2025)

First Author: Schmitt D

Attributed to: Expanding the Environmental Frontiers of Operando Metrology for Advanced Device Materials Development funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41566-024-01568-y

Publication URI: http://dx.doi.org/10.1038/s41566-024-01568-y

Type: Journal Article/Review

Parent Publication: Nature Photonics

ISSN: 1749-4885