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Low-Cost, Multi-Sensor Non-Destructive Banana Ripeness Estimation Using Machine Learning (2025)

First Author: Callaghan K

Attributed to: Manufacturing in Hospital: BioMed 4.0 funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jsen.2025.3528250

Publication URI: http://dx.doi.org/10.1109/jsen.2025.3528250

Type: Journal Article/Review

Parent Publication: IEEE Sensors Journal