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Unravelling the Impact of Random Dopant Fluctuations on Si-Based 3nm NSFET: A NEGF Analysis (2024)

First Author: Dixit A

Attributed to: Quantum Electronics Device Modelling (QUANTDEVMOD) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/nano61778.2024.10628880

Publication URI: http://dx.doi.org/10.1109/nano61778.2024.10628880

Type: Conference/Paper/Proceeding/Abstract