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Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction (2025)

First Author: Waters D

Attributed to: Quantitative non-destructive nanoscale characterisation of advanced materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0244438

Publication URI: http://dx.doi.org/10.1063/5.0244438

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 4