📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions (2022)

First Author: Zhong X

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927622001155

Publication URI: http://dx.doi.org/10.1017/s1431927622001155

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S1