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Using XeF2 gas and focused ion beam (XeF2-FIB) imaging to contrast and quantify precipitation in metal (2025)

First Author: Thomas P

Attributed to: Cutting the Edge - a Plasma Focused Ion Beam (PFIB) facility for supporting UK research in novel 3D materials research and device fabrication funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.matchar.2025.114806

Publication URI: http://dx.doi.org/10.1016/j.matchar.2025.114806

Type: Journal Article/Review

Parent Publication: Materials Characterization