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Atom Probe Tomography Investigation of the Impact of Stacking Faults on InGaN/GaN Quantum Well LED Systems (2024)

First Author: Shu R

Attributed to: Fast Switching zincblende-GaN LEDs funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1093/mam/ozae044.024

Publication URI: http://dx.doi.org/10.1093/mam/ozae044.024

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: Supplement_1

ISSN: 14358115 14319276