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An accessible Secondary Electron Hyperspectral Imaging approach to draw meaningful insights from scanning electron microscopy (2024)

First Author: Nohl J

Attributed to: SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimisation for Reliable Manufacturing of Key Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1051/bioconf/202412906003

Publication URI: http://dx.doi.org/10.1051/bioconf/202412906003

Type: Journal Article/Review

Parent Publication: BIO Web of Conferences