Measurement of UKRI-MPW0 after irradiation: an HV-CMOS prototype for high radiation tolerance (2024)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/19/03/c03061
Publication URI: http://dx.doi.org/10.1088/1748-0221/19/03/c03061
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 03