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Enhancing precision in line-scan chromatic confocal sensors through bimodal signal pattern (2025)

First Author: Dai J

Attributed to: Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.optlastec.2024.111417

Publication URI: http://dx.doi.org/10.1016/j.optlastec.2024.111417

Type: Journal Article/Review

Parent Publication: Optics & Laser Technology