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Computer Vision-enhanced In-situ Surface Topography Measurement with Focus Variation Microscopy for Material Extrusion-based Additive Manufacturing (2024)

First Author: Yin K

Attributed to: Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/icac61394.2024.10718829

Publication URI: http://dx.doi.org/10.1109/icac61394.2024.10718829

Type: Conference/Paper/Proceeding/Abstract