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Defect Density of States of Tin Oxide and Copper Oxide p-type Thin-film Transistors (2025)

First Author: Mattsson MJ

Attributed to: Innovative Material, Processes and Devices for Low Power Flexible Electronics: Creating a Sustainable Internet of Everything funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://doi.org/10.1002/aelm.202400929

Type: Journal Article/Review

Parent Publication: Advanced Electronic Materials