Single-shot wavelength meter on a chip based on exponentially increasing delays and in-phase quadrature detection (2024)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.optlaseng.2024.108163
Publication URI: http://dx.doi.org/10.1016/j.optlaseng.2024.108163
Type: Journal Article/Review
Parent Publication: Optics and Lasers in Engineering
ISSN: 0143-8166